Walter Bich: search on Z-Library

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1

Special issue on Statistical and Probabilistic Methods for Metrology

Bich, Walter, Cox, Maurice G

Journal:

Year:

2006

Language:

english

File:

PDF, 42 KB

english, 2006

2

Ultra-thin body & buried oxide SOI substrate development and qualification for Fully Depleted SOI device with back bias capability

Schwarzenbach, Walter, Nguyen, Bich-Yen, Allibert, Frederic, Girard, Christophe, Maleville, Christophe

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 2.33 MB

english, 2016

3

Towards a new GUM—an update

Bich, Walter, Cox, Maurice, Michotte, Carine

Journal:

Year:

2016

Language:

english

File:

PDF, 614 KB

english, 2016

4

Simultaneous determination of mass and volume of a standard by weighings in air

Malengo, Andrea, Bich, Walter

Journal:

Year:

2012

Language:

english

File:

PDF, 2.00 MB

english, 2012

5

Calibrations by comparison in metrology: A survey

Walter Bich, Patrizia Tavella

Journal:

ISA Transactions

Year:

1994

Language:

english

File:

PDF, 651 KB

english, 1994

6

How to revise the GUM?

Journal:

Accreditation and Quality Assurance

Year:

2008

Language:

english

File:

PDF, 136 KB

english, 2008

7

Interdependence between measurement uncertainty and metrological traceability

Journal:

Accreditation and Quality Assurance

Year:

2009

Language:

english

File:

PDF, 236 KB

english, 2009

8

Evolution of the âGuide to the Expression of Uncertainty in Measurementâ

Bich, Walter, Cox, Maurice G, Harris, Peter M

Journal:

Year:

2006

Language:

english

File:

PDF, 93 KB

english, 2006

9

Revision of the ‘ Guide to the Expression of Uncertainty in Measurement ’

Bich, Walter, Cox, Maurice G, Dybkaer, René, Elster, Clemens, Estler, W Tyler, Hibbert, Brynn, Imai, Hidetaka, Kool, Willem, Michotte, Carine, Nielsen, Lars, Pendrill, Leslie, Sidney, Steve, Veen, Adr

Journal:

Year:

2012

Language:

english

File:

PDF, 137 KB

english, 2012

10

Human being as a part of measuring system influencing measurement results

Kuselman, Ilya, Pennecchi, Francesca, Bich, Walter, Brynn Hibbert, D.

Journal:

Accreditation and Quality Assurance

Year:

2016

Language:

english

File:

PDF, 338 KB

english, 2016

11

[IEEE 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2019.4.22-2019.4.25)] 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Low temperature junctionless device stacking enabled by leading edge sequential 3D integration

Besnard, Guillaume, Gaudin, Gweltaz, Schwarzenbach, Walter, Ecarnot, Ludovic, Radu, Ionut, Nguyen, Bich-Yen, Vandooren, Anne, Collaert, Nadine

Year:

2019

Language:

english

File:

PDF, 651 KB

english, 2019

12

Comment on âPhysics without determinism: Alternative interpretations of classical physicsâ

Callegaro, Luca, Pennecchi, Francesca, Bich, Walter

Journal:

Physical Review A

Year:

2020

File:

PDF, 128 KB

2020

13

Realization and dissemination of units in a revised SI

Franco Cabiati, Walter Bich

Journal:

Year:

2009

Language:

english

File:

PDF, 270 KB

english, 2009

14

Newton's Laws, Planck's Principle, and Metrology in Chemistry

Journal:

Accreditation and Quality Assurance

Year:

2006

Language:

english

File:

PDF, 110 KB

english, 2006

15

Estimation in multiple measurements

Journal:

Accreditation and Quality Assurance

Year:

2009

Language:

english

File:

PDF, 202 KB

english, 2009

16

Etiology of unilateral hearing loss in a national hereditary deafness repository

Kelley M. Dodson, Alexandros Georgolios, Noelle Barr, Bich Nguyen, Aristides Sismanis, Kathleen S. Arnos, Virginia W. Norris, Derek Chapman, Walter E. Nance, Arti Pandya

Journal:

American Journal of Otolaryngology

Year:

2012

Language:

english

File:

PDF, 172 KB

english, 2012

17

Thoughts on a changing SI

Cabiati, Franco, Bich, Walter

Journal:

Year:

2009

Language:

english

File:

PDF, 151 KB

english, 2009

18

[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of ESSCIRC - FDSOI: From substrate to devices and circuit applications

Mazure, Carlos, Ferrant, Richard, Nguyen, Bich-Yen, Schwarzenbach, Walter, Moulin, Cecile

Year:

2010

Language:

english

File:

PDF, 774 KB

english, 2010

19

[IEEE 2007 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement - Sardagna, Italy (2007.07.16-2007.07.18)] 2007 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement - Uncertainty Propagation in a Non-linear Regression Analysis: Application to a Ballistic Absolute Gravimeter (IMGC-02)

Bich, Walter, D'Agostino, Giancarlo, Germak, Alessandro, Pennecchi, Francesca

Year:

2007

Language:

english

File:

PDF, 1.83 MB

english, 2007

20

[IEEE 2008 IEEE Iinternational Workshop on Advanced Methods for Uncertainty Estimation in Measurement (AMUEM) - Sardagna, Italy (2008.07.21-2008.07.22)] 2008 IEEE Iinternational Workshop on Advanced Methods for Uncertainty Estimation in Measurement - Evaluating measurement uncertainty in absolute gravimetry: An application of the Monte Carlo method

Bich, Walter, D'Agostino, Giancarlo, Germak, Alessandro, Pennecchi, Francesca

Year:

2008

Language:

english

File:

PDF, 497 KB

english, 2008

21

Revision of the ‘ Guide to the Expression of Uncertainty in Measurement ’. Why and how

Journal:

Year:

2014

Language:

english

File:

PDF, 157 KB

english, 2014

22

Uncertainty in measurements by counting

Bich, Walter, Pennecchi, Francesca

Journal:

Year:

2012

Language:

english

File:

PDF, 116 KB

english, 2012

23

Non-linear models and best estimates in the GUM

Bich, Walter, Callegaro, Luca, Pennecchi, Francesca

Journal:

Year:

2006

Language:

english

File:

PDF, 429 KB

english, 2006

24

ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Ultra-Thin Film SOI/BOX Substrate Development, Its Application and Readiness

Schwarzenbach, Walter, Cauchy, Xavier, Bonnin, Olivier, Daval, Nicolas, Aulnette, Cécile, Girard, Christophe, Nguyen, Bich-Yen, Maleville, Christophe

Year:

2011

Language:

english

File:

PDF, 480 KB

english, 2011

25

Buoyancy contribution to uncertainty of mass, conventional mass and force

Malengo, Andrea, Bich, Walter

Journal:

Year:

2016

Language:

english

File:

PDF, 640 KB

english, 2016

26

Corrigendum: Buoyancy contribution to uncertainty of mass, conventional mass and force (2016 Metrologia 53 762–9)

Malengo, Andrea, Bich, Walter

Journal:

Year:

2018

Language:

english

File:

PDF, 231 KB

english, 2018

27

Highly Scaled Strained Silicon-On-Insulator Technology for the 5G Era: Impact of Geometry and Annealing on Strain Retention and Device Performance of nMOSFETs

Kong, Eugene Y.-J., Yadav, Sachin, Lei, Dian, Kang, Yuye, Sivan, Maheswari, Li, Yida, Nguyen, Bich-Yen, Schwarzenbach, Walter, Ecarnot, Ludovic, Sellier, Manuel, Maleville, Christophe, Thean, Aaron V.

Journal:

IEEE Transactions on Electron Devices

Year:

2019

Language:

english

File:

PDF, 3.64 MB

english, 2019

28

Erratum: ‘Buoyancy contribution to uncertainty of mass, conventional mass and force’ (2016 Metrologia 53 762–9)

Malengo, Andrea, Bich, Walter

Journal:

Year:

2016

Language:

english

File:

PDF, 229 KB

english, 2016

29

(Keynote) Low Temperature SmartCut TM Process for 3D Integration

Schwarzenbach, Walter, Reboh, Shay, Ghorbel, Aymen, Gaudin, Gweltaz, Besnard, Guillaume, Mazen, FrÃ©dÃ©ric, Loup, Virginie, Maitrejean, Sylvain, Brunet, Laurent, Nguyen, Bich-Yen, Maleville, Christoph

Journal:

ECS Transactions

Year:

2020

File:

PDF, 575 KB

2020

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